DocumentCode :
2933486
Title :
Low-cost electrochemical impedance spectroscopy system for corrosion monitoring of metallic antiquities and works of art
Author :
Carullo, A. ; Ferraris, F. ; Parvis, M. ; Vallan, A. ; Angelini, E. ; Spinelli, P.
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
Volume :
3
fYear :
1999
fDate :
1999
Firstpage :
1680
Abstract :
Electrochemical impedance spectroscopy (EIS) is recognised to be a powerful and non-invasive technique to test the integrity of protective coatings on memorials, but commercial EIS systems are rather costly though versatile devices. This paper describes a low cost and portable EIS system that is based on a compact DSP board. Such an EIS system employs a front end, which is based on a transimdedance amplifiers, and embeds the potentiostatic functions so that the EIS system can be used without requiring an external potentiostat. The software that runs on the DSP is designed to analyse the electrochemical impedance only in a reduced frequency range in order to produce a simple “corrosion alert” result. The device is equipped with a digital interface and can be connected to a portable personal computer to carry out a complete frequency analysis and perform a more complex data processing
Keywords :
art; corrosion protective coatings; corrosion testing; electric impedance measurement; electrochemical analysis; portable instruments; DSP board; antiquity; corrosion monitoring; data processing; digital interface; electrochemical impedance spectroscopy; frequency analysis; memorial; metallic artifact; noninvasive technique; portable EIS system; potentiostatic function; protective coating; transimdedance amplifier; work of art; Coatings; Costs; Data processing; Digital signal processing; Electrochemical impedance spectroscopy; Frequency; Microcomputers; Performance analysis; Power system protection; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
ISSN :
1091-5281
Print_ISBN :
0-7803-5276-9
Type :
conf
DOI :
10.1109/IMTC.1999.776109
Filename :
776109
Link To Document :
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