Title :
A parallel genetic algorithm for service restoration in electric power distribution systems
Author :
Fukuyama, Yoshikazu ; Chiang, Hsaio-Dong
Author_Institution :
Fuji Electr. Corp. Res. & Dev. Ltd., Tokyo, Japan
Abstract :
This paper develops a coarse-gain parallel genetic algorithm for solving a service restoration problem in electric power distribution systems. A power utility performs service restoration in order to restore out-of-service areas at fault. Developing an effective service restoration procedure is a cost-effective approach to improve service reliability and to enhance customer satisfaction. The main objective in service restoration procedure is to restore as much load as possible by transferring de-energized loads via network reconfigurations to other supporting distribution feeders without violating operating and engineering constraints. Details of the parallel genetic algorithm developed in this paper are described. The proposed method is implemented on transputers for parallel computation. The feasibility of the developed algorithm for service restoration is demonstrated on several distribution networks with promising results
Keywords :
distribution networks; genetic algorithms; parallel algorithms; power system analysis computing; power system reliability; power system restoration; transputer systems; transputers; coarse-gain parallel genetic algorithm; de-energized loads transfer; electric power distribution systems; load restoration; network reconfigurations; out-of-service areas; parallel computation; parallel genetic algorithm; service reliability improvement; service restoration; transputers; Circuit faults; Customer satisfaction; Generators; Genetic algorithms; Nuclear power generation; Power generation; Power system reliability; Power system restoration; Reliability engineering; Switches;
Conference_Titel :
Fuzzy Systems, 1995. International Joint Conference of the Fourth IEEE International Conference on Fuzzy Systems and The Second International Fuzzy Engineering Symposium., Proceedings of 1995 IEEE Int
Conference_Location :
Yokohama
Print_ISBN :
0-7803-2461-7
DOI :
10.1109/FUZZY.1995.409692