Title :
Interference fringes analysis based on recurrence non-linear filtering methodology
Author_Institution :
Inst. of Fine Mech. & Opt., St. Petersburg Tech. Univ., Russia
Abstract :
The interferometry technique is widely used in dimensional metrology, optical testing and modern precision technologies. The intensity of interference fringes depends on phase, frequency or visibility maximum position non-linearly, but namely the parameters pointed contain the useful information about the object to be tested. Well known methods based on the recovery of analytical signal parameters and the phase shifting interferometry technique have not enough noise-immunity and require to register the whole data series before parameter calculation. We propose a new approach to interference fringes analysis. Interferometric data are assumed to be a series of samples of the interferometric signal defined by known model. The signal value from the previous step to the next step is predicted. The prediction error is used for signal parameters correction. Recurrence non-linear processing generally gives the optimal dynamic assessment of phase, frequency and visibility maximum position. Stability and accuracy of recurrence non-linear filtering of interference fringes were investigated. Optimal nonlinear algorithms were developed with application to conventional one-wavelength interferometry, to two-wavelength and low coherent interferometers
Keywords :
image processing; light interference; light interferometry; nonlinear filters; optical information processing; optical testing; spatial filters; accuracy; analytical signal parameters; data series; dimensional metrology; interference fringes; interference fringes analysis; interferometric data; interferometric signal; interferometry technique; low coherent interferometers; noise-immunity; one-wavelength interferometry; optical testing; optimal dynamic assessment; optimal nonlinear algorithms; parameter calculation; phase shifting interferometry technique; precision technologies; prediction error; recurrence nonlinear filtering; recurrence nonlinear filtering methodology; recurrence nonlinear processing; signal parameters correction; signal value; stability; two-wavelength interferometers; visibility maximum position; Frequency; Interference; Metrology; Nonlinear optics; Optical filters; Optical interferometry; Phase noise; Phase shifting interferometry; Signal analysis; Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
Print_ISBN :
0-7803-5276-9
DOI :
10.1109/IMTC.1999.776125