• DocumentCode
    2933818
  • Title

    Simulation of polarity independent RESET in electrochemical metallization memory cells

  • Author

    Menzel, Stephan ; Valov, I. ; Waser, Rainer ; Adler, Nico ; van den Hurk, Job ; Tappertzhofen, S.

  • Author_Institution
    Peter Grunberg Inst. (PGI-7), Forschungszentrum Julich, Julich, Germany
  • fYear
    2013
  • fDate
    26-29 May 2013
  • Firstpage
    92
  • Lastpage
    95
  • Abstract
    Redox-based resistive switching devices are a potential candidate for future non-volatile memory. One type of these devices is the electrochemical metallization cell (ECM), which typically exhibit a bipolar operation scheme. However, at high current levels a transition to polarity independent RESET switching has been observed. This work presents a numerical simulation model of the RESET operation in ECM cells, which is capable of explaining the occurrence of polarity-independent RESET switching. The model is based on the thermally activated electrochemical dissolution of a conducting filament.
  • Keywords
    integrated circuit metallisation; numerical analysis; random-access storage; ECM; bipolar operation; conducting filament; electrochemical dissolution; electrochemical metallization memory cells; nonvolatile memory; numerical simulation; polarity independent RESET switching; redox-based resistive switching devices; Conductivity; Electrodes; Electronic countermeasures; Mathematical model; Numerical models; Switches; Thermal conductivity; electrochemical metallization cells ECM; resistive switching memory (ReRAM); unipolar switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Workshop (IMW), 2013 5th IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4673-6168-2
  • Type

    conf

  • DOI
    10.1109/IMW.2013.6582106
  • Filename
    6582106