Title :
On the guaranteed failing and working frequencies in path delay fault analysis
Author :
Peng, Qiang ; Agrawal, Vishwani D. ; Savir, Jacob
Author_Institution :
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
Abstract :
When running a set of test vectors to detect path delay faults in a digital system, desired test frequencies are needed. In this paper we determine the guaranteed failure frequency (GFF) and the guaranteed working frequency (GWF) for a given set of test vectors used for path delay testing of a sequential circuit. If the circuit passes the test when the vectors are applied at GFF, then all paths activated by those vectors are guaranteed to be free from delay faults provided the clock frequency does not exceed the GWF. Ambiguity cancellation and minmax-delay or statistical-delay modeling techniques are used in a timing simulation system to determine GFF and GWF. Experiments show that by using the guaranteed failure frequency, we can obtain the best (most reliable) path delay fault coverage provided by the given test vectors
Keywords :
automatic test pattern generation; design for testability; fault simulation; logic testing; minimax techniques; sequential circuits; timing; ambiguity cancellation; deterministic vectors; digital system; guaranteed failure frequency; guaranteed working frequency; minmax-delay modeling; nearly optimal delay fault coverage; path delay fault analysis; selective hazard suppression; sequential circuit; set of test vectors; statistical-delay modeling; timing simulation system; Circuit faults; Circuit testing; Delay; Digital systems; Electrical fault detection; Fault detection; Frequency; Sequential analysis; Sequential circuits; System testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
Print_ISBN :
0-7803-5276-9
DOI :
10.1109/IMTC.1999.776130