DocumentCode
2933894
Title
The effect of V2O5 on high-frequency properties for W-type barium ferrite composites Z.W. Li, Y. P.Wu and G. Q. Lin Temasek laboratories, National University of Singapore, 10 Kent Ridge Crescent, Singapore, 119260 Tao Liu Singapore Synchrotron Light Sourc
Author
Li, Z. ; Wu, Y. ; Lin, G. ; Liu, T.
Author_Institution
Nat. Univ. of Singapore, Singapore
fYear
2006
fDate
8-12 May 2006
Firstpage
56
Lastpage
56
Abstract
Ferrite/polymer composites were prepared by mixing ferrite powders with epoxy resin. The powders are W-type barium ferrites BaCoxZn2-xFe16O27 (x=1.0, 1.3 and 1.5) doped with V2O5 of 0-1.5 wt%. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), extended X-ray absorption fine structure spectroscopy (EXAFS), scanning electron microscope (SEM), electric resistivity, static and high-frequency magnetic measurements were performed to study the microstructure, static and high-frequency properties of the composites. The experimental results show that the doping of V2O5 can effectively modify the shape of particles, greatly decrease the value of real permittivity, and significantly enhance the complex permeability. The composites, therefore, are potential candidates for EM attenuation materials with low reflectivity and broad bandwidth.
Keywords
EXAFS; X-ray diffraction; X-ray photoelectron spectra; barium compounds; cobalt compounds; electrical resistivity; ferrites; filled polymers; high-frequency effects; magnetic permeability; permittivity; scanning electron microscopy; vanadium compounds; zinc compounds; BaCoZn2Fe16O27:V2O5; EXAFS; SEM; W-type barium ferrite composites; X-ray diffraction; X-ray photoelectron spectroscopy; XPS; XRD; doping; electric resistivity; electromagnetic attenuation materials; epoxy resin; extended X-ray absorption fine structure spectroscopy; ferrite-polymer composites; high-frequency magnetic properties; magnetic permeability; microstructure; permittivity; scanning electron microscope; Barium; Epoxy resins; Ferrites; Laboratories; Polymers; Powders; Scanning electron microscopy; Silicon compounds; Spectroscopy; Zinc;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location
San Diego, CA
Print_ISBN
1-4244-1479-2
Type
conf
DOI
10.1109/INTMAG.2006.375556
Filename
4261490
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