• DocumentCode
    2933992
  • Title

    The sensitivity of a method to predict a capacitor´s frequency characteristic

  • Author

    Avramov-Zamurovic, Svetlana ; Koffman, Andrew D. ; Oldham, Nile M. ; Waltrip, Bryan C.

  • Author_Institution
    US Naval Acad., Annapolis, MD, USA
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1829
  • Abstract
    Several groups have worked on the characterization of four terminal-pair (4TP) capacitance standards at high frequencies. This paper describes a variation of the technique to predict a capacitor´s frequency characteristic. The method is sensitive to regression parameter selection and the paper gives a detailed analysis of the techniques used to calculate reasonable values for these parameters. The results of the analysis of the capacitor frequency characteristic prediction method´s sensitivity to exponent parameter variation have shown that this sensitivity is a major uncertainty component in the uncertainty analysis of NIST´s capacitance standard measurement system
  • Keywords
    capacitance measurement; capacitors; measurement standards; measurement uncertainty; NIST measurement system; capacitor frequency characteristic prediction; four terminal-pair capacitance standard; regression parameter selection; sensitivity; uncertainty analysis; Capacitance measurement; Capacitors; Circuits; Difference equations; Frequency measurement; Impedance measurement; NIST; Performance analysis; Performance evaluation; Regression analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
  • Conference_Location
    Venice
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5276-9
  • Type

    conf

  • DOI
    10.1109/IMTC.1999.776136
  • Filename
    776136