Noise in high-speed digital-to-analog converters

Author

Bourgeois, P.-Y. ; Imaike, T. ; Goavec-Merou, G. ; Rubiola, E.

Author_Institution

Time & Freq. Dept., Univ. of Franche-Comte, Besancon, France

fYear

2015

fDate

12-16 April 2015

Firstpage

672

Lastpage

675

Abstract

We report on the measurement of phase noise of high speed analog to digital converters in a full digital measurement setup and for various development boards. The tested configurations ensures a Nyquist rate higher than 100 MHz suitable for conventional ultralow noise devices. Several analog to digital converters featuring a SNR higher than 140 dB enable the measurement of AM and PM noise with a background noise of -185 dBc (floor) and -160 dBc (flicker, 10 Hz off the carrier) using cross-correlation technique.

Keywords

analogue-digital conversion; digital-analogue conversion; noise measurement; phase measurement; phase noise; AM noise measurement; Nyquist rate; PM noise measurement; SNR; analog to digital converter; cross-correlation technique; digital measurement setup; digital-to-analog converter; phase noise measurement; ultralownoise device; Analog-digital conversion; Field programmable gate arrays; Frequency measurement; Noise measurement; Phase measurement; Phase noise;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium & the European Frequency and Time Forum (FCS), 2015 Joint Conference of the IEEE International

Conference_Location

Denver, CO

Print_ISBN

978-1-4799-8865-5

Type

conf

DOI

10.1109/FCS.2015.7138932

Filename

7138932