• DocumentCode
    2934370
  • Title

    Are we over designing for solder joint reliability? Field vs. accelerated conditions, realistic vs. specified requirements

  • Author

    Syed, Ahmer ; Doty, Matthew

  • Author_Institution
    Amkor Technol., Chandler, AZ, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    111
  • Lastpage
    117
  • Abstract
    The recent trend towards miniaturization is requiring engineers to look for packages which are near chip size and have finer pitch I/Os with small solder joints. Although the reliability of solder joints may not meet the field life requirements in some cases the engineer may have to select a package that is not optimum for electrical and thermal performance, may not meet size and density requirements or does not meet price targets. Faced with such a situation, an engineer is forced to ask whether the reliability requirements are realistic and if the system is being over designed to meet those requirements? This paper seeks to answer these questions. An industry survey of reliability requirements for various applications is presented, showing inconsistencies within industry groups. Various thermal cycle field conditions are discussed and a validated life prediction approach is used to determine the acceleration factors from field to accelerated test conditions. A comparison is made between realistic and specified reliability requirements for various applications to determine if the systems are being over designed. Acceleration factors for different test conditions are also presented to help sort out the published data on solder joint reliability
  • Keywords
    fine-pitch technology; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; life testing; production testing; soldering; IC packaging; accelerated conditions; acceleration factors; density requirements; field conditions; finer pitch I/Os; price targets; solder joint reliability; validated life prediction; Acceleration; Chip scale packaging; Design engineering; Electronics packaging; Lead; Life estimation; Reliability engineering; Soldering; Testing; Thermal engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-5231-9
  • Type

    conf

  • DOI
    10.1109/ECTC.1999.776158
  • Filename
    776158