DocumentCode
2934370
Title
Are we over designing for solder joint reliability? Field vs. accelerated conditions, realistic vs. specified requirements
Author
Syed, Ahmer ; Doty, Matthew
Author_Institution
Amkor Technol., Chandler, AZ, USA
fYear
1999
fDate
1999
Firstpage
111
Lastpage
117
Abstract
The recent trend towards miniaturization is requiring engineers to look for packages which are near chip size and have finer pitch I/Os with small solder joints. Although the reliability of solder joints may not meet the field life requirements in some cases the engineer may have to select a package that is not optimum for electrical and thermal performance, may not meet size and density requirements or does not meet price targets. Faced with such a situation, an engineer is forced to ask whether the reliability requirements are realistic and if the system is being over designed to meet those requirements? This paper seeks to answer these questions. An industry survey of reliability requirements for various applications is presented, showing inconsistencies within industry groups. Various thermal cycle field conditions are discussed and a validated life prediction approach is used to determine the acceleration factors from field to accelerated test conditions. A comparison is made between realistic and specified reliability requirements for various applications to determine if the systems are being over designed. Acceleration factors for different test conditions are also presented to help sort out the published data on solder joint reliability
Keywords
fine-pitch technology; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; life testing; production testing; soldering; IC packaging; accelerated conditions; acceleration factors; density requirements; field conditions; finer pitch I/Os; price targets; solder joint reliability; validated life prediction; Acceleration; Chip scale packaging; Design engineering; Electronics packaging; Lead; Life estimation; Reliability engineering; Soldering; Testing; Thermal engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
0-7803-5231-9
Type
conf
DOI
10.1109/ECTC.1999.776158
Filename
776158
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