DocumentCode :
2934513
Title :
A scale-invariant local descriptor for event recognition in 1D sensor signals
Author :
Xie, Jierui ; Beigi, Mandis S.
Author_Institution :
Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
2009
fDate :
June 28 2009-July 3 2009
Firstpage :
1226
Lastpage :
1229
Abstract :
In this paper, we introduce a shape-based, time-scale invariant feature descriptor for 1-D sensor signals. The timescale invariance of the feature allows us to use feature from one training event to describe events of the same semantic class which may take place over varying time scales such as walking slow and walking fast. Therefore it requires less training set. The descriptor takes advantage of the invariant location detection in the scale space theory and employs a high level shape encoding scheme to capture invariant local features of events. Based on this descriptor, a scale-invariant classifier with ldquoRrdquo metric (SIC-R) is designed to recognize multi-scale events of human activities. The R metric combines the number of matches of keypoint in scale space with the Dynamic Time Warping score. SIC-R is tested on various types of 1-D sensors data from passive infrared, accelerometer and seismic sensors with more than 90% classification accuracy.
Keywords :
feature extraction; image sensors; pattern recognition; time series; 1D sensor signals; accelerometer; dynamic time warping score; event recognition; high level shape encoding scheme; human activities; location detection; multiscale events; passive infrared; scale space theory; scale-invariant classifier; scale-invariant local descriptor; seismic sensors; Convolution; Detectors; Event detection; Feature extraction; Gaussian processes; Infrared image sensors; Infrared sensors; Legged locomotion; Sensor phenomena and characterization; Shape; Event recognition; local feature descriptor; multi-scale; scale-invariant;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
Conference_Location :
New York, NY
ISSN :
1945-7871
Print_ISBN :
978-1-4244-4290-4
Electronic_ISBN :
1945-7871
Type :
conf
DOI :
10.1109/ICME.2009.5202722
Filename :
5202722
Link To Document :
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