Title :
Effect of thermal residual stresses on the apparent interfacial fracture toughness of polymer/metal interface
Author :
Yao, Qizhou ; Qu, Jianmin
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
In this study, the apparent fracture toughness of the interfaces of several epoxy-based polymeric adhesives and metal (aluminum) substrate is experimentally measured. Double layer specimens with initial interfacial cracks are made for four-point bending tests. Thermal residual stresses exist on the interface due to the coefficient of thermal expansion (CTE) mismatch between the underfill and aluminum. Silica fillers are used to modify the CTE of the epoxy-based adhesives so that various levels of interface thermal residual stresses are achieved. Finite element analysis is also performed to quantify the effects of CTE mismatch as well as the elastic mismatch across the interface. It is found that the apparent interfacial toughness is significantly affected by the thermal residual stress, while the effect of elastic mismatch is negligible. In general thermal residual stress undermines the resistance to an interfacial crack. In some cases the residual stress is sufficient to result in adhesive and/or cohesive failure
Keywords :
adhesives; bending; encapsulation; failure analysis; finite element analysis; fracture toughness testing; internal stresses; thermal expansion; thermal stresses; adhesive failure; apparent interfacial fracture toughness; coefficient of thermal expansion mismatch; cohesive failure; elastic mismatch; epoxy-based polymeric adhesives; finite element analysis; four-point bending tests; interfacial toughness; polymer/metal interface; thermal residual stresses; underfill; Aluminum; Finite element methods; Performance analysis; Polymers; Residual stresses; Silicon compounds; Testing; Thermal expansion; Thermal resistance; Thermal stresses;
Conference_Titel :
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-5231-9
DOI :
10.1109/ECTC.1999.776199