Title :
A new approach to the measurement of surface roughness using the pulse-jet capacitance method
Author :
Radhakrishnan, V. ; Achutan, N. ; Verghese, Saji ; Santoshkumar, R.
Author_Institution :
Dept. of Mech. Eng., Inst. of Technol., Madras, India
Abstract :
In-process monitoring of surface roughness has assumed considerable significance in present day manufacturing due to reduced tolerances and better understanding of the functional behaviour of surfaces. The paper deals with the pulse jet capacitance system for noncontact sensing of the surface finish. It concentrates on the prototype development and testing for this state of the art technique useful for research or industrial applications
Keywords :
capacitance measurement; electric sensing devices; machining; process control; pulse generators; surface topography measurement; functional behaviour; in-process monitoring; industrial applications; machining operations; manufacturing; noncontact sensing; process monitoring; prototype development; pulse jet capacitance system; pulse-jet capacitance method; state of the art technique; surface finish; surface roughness; Capacitance measurement; Conducting materials; Machining; Monitoring; Pollution measurement; Probes; Pulse measurements; Rough surfaces; Surface roughness; Surface topography;
Conference_Titel :
Electronic Technology Directions to the Year 2000, 1995. Proceedings.
Conference_Location :
Adelaide, SA
Print_ISBN :
0-8186-7085-1
DOI :
10.1109/ETD.1995.403509
