• DocumentCode
    2935696
  • Title

    Power electronic circuit reliability analysis incorporating parallel simulations

  • Author

    Kamas, L.A. ; Sanders, Seth R.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • fYear
    1996
  • fDate
    11-14 Aug 1996
  • Firstpage
    45
  • Lastpage
    51
  • Abstract
    This paper presents and applies reliability analysis methods to power electronic circuit simulation. The focus is on the first-order reliability method (FORM). Two circuits are analyzed: an open-loop updown power converter; and a similar closed-loop circuit that is currently in mass production. The open-loop circuit provides an example from which rich quantitative data can be obtained for various methods. The closed-loop production design circuit provides a proof-of-concept for a FORM application on a complex design. The implementation includes parallel gradient computations across six networked workstations. The parallel environment is described in detail
  • Keywords
    circuit analysis computing; circuit reliability; failure analysis; parallel processing; power convertors; circuit reliability analysis; closed-loop power converter circuit; computer simulation; first-order reliability method; networked workstations; open-loop updown power converter; parallel environment; parallel gradient computations; parallel simulations; power electronic circuits; Analytical models; Circuit analysis; Circuit analysis computing; Circuit simulation; Computational modeling; Computer simulation; Concurrent computing; Monte Carlo methods; Power electronics; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computers in Power Electronics, 1996., IEEE Workshop on
  • Conference_Location
    Portland, OR
  • ISSN
    1093-5142
  • Print_ISBN
    0-7803-3977-0
  • Type

    conf

  • DOI
    10.1109/CIPE.1996.612335
  • Filename
    612335