Title :
Power electronic circuit reliability analysis incorporating parallel simulations
Author :
Kamas, L.A. ; Sanders, Seth R.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
This paper presents and applies reliability analysis methods to power electronic circuit simulation. The focus is on the first-order reliability method (FORM). Two circuits are analyzed: an open-loop updown power converter; and a similar closed-loop circuit that is currently in mass production. The open-loop circuit provides an example from which rich quantitative data can be obtained for various methods. The closed-loop production design circuit provides a proof-of-concept for a FORM application on a complex design. The implementation includes parallel gradient computations across six networked workstations. The parallel environment is described in detail
Keywords :
circuit analysis computing; circuit reliability; failure analysis; parallel processing; power convertors; circuit reliability analysis; closed-loop power converter circuit; computer simulation; first-order reliability method; networked workstations; open-loop updown power converter; parallel environment; parallel gradient computations; parallel simulations; power electronic circuits; Analytical models; Circuit analysis; Circuit analysis computing; Circuit simulation; Computational modeling; Computer simulation; Concurrent computing; Monte Carlo methods; Power electronics; Sampling methods;
Conference_Titel :
Computers in Power Electronics, 1996., IEEE Workshop on
Conference_Location :
Portland, OR
Print_ISBN :
0-7803-3977-0
DOI :
10.1109/CIPE.1996.612335