DocumentCode :
2935792
Title :
Using reconfigurable FPGAs in test equipment applications
Author :
Fawcett, Bradly K.
Author_Institution :
Xilinx Inc., San Jose, CA, USA
fYear :
1994
fDate :
27-29 Sep 1994
Firstpage :
562
Lastpage :
567
Abstract :
Since their introduction in 1985, Field Programmable Gate Array (FPGA) devices have been used in tens of thousands of designs. In most of these, logic implemented in an FPGA could have been implemented with more traditional logic devices-masked gate arrays, or MSI/SSI devices, for example. However, FPGAs were a better alternative for any number of reasons-no nonrecurring engineering costs, lower design risks, less power dissipation, faster design and production cycles, etc. In essence, FPGAs combine the high-integration benefits of gate arrays with the time-to-market benefits of a user-programmable device, and typically are selected over other logic technologies to gain these benefits
Keywords :
field programmable gate arrays; logic design; random-access storage; reconfigurable architectures; test equipment; design cycles; design risks; high-integration benefits; logic technologies; nonrecurring engineering costs; power dissipation; production cycles; reconfigurable FPGAs; test equipment applications; time-to-market benefits; user-programmable device; Costs; Design engineering; Field programmable gate arrays; Logic arrays; Logic devices; Logic gates; Power engineering and energy; Programmable logic arrays; Reconfigurable logic; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
WESCON/94. Idea/Microelectronics. Conference Record
Conference_Location :
Anaheim , CA
ISSN :
1095-791X
Print_ISBN :
0-7803-9992-7
Type :
conf
DOI :
10.1109/WESCON.1994.403536
Filename :
403536
Link To Document :
بازگشت