DocumentCode
2935924
Title
Embedding virtual test points in PCBs
Author
Chenoweth, David ; Muegge, Mark
Author_Institution
Quality Semicond. Inc., Santa Clara, CA, USA
fYear
1994
fDate
27-29 Sep 1994
Firstpage
529
Lastpage
533
Abstract
Boundary scan is currently the most popular diagnostic tool for high performance systems and plays a key role in overcoming hesitation for using fine pitch packaging. The hands-on test philosophies of the past are transcended with the ability to test a complex circuit internally and externally from a computer terminal. There is a realization that JTAG will quickly pay for itself by reducing the test and integration time. JTAG acceptance continues to increase with the introduction of more boundary scan devices. Major breakthroughs in integrated circuit design, such as Quality Semiconductor´s QuickScan Technology, add endless alternatives for implementing JTAG in a system. QuickScan devices give the designer immediate JTAG coverage without the common performance penalty
Keywords
automatic testing; boundary scan testing; integrated circuit testing; logic testing; printed circuit testing; IC testing; JTAG coverage; PC testing; PCBs; QuickScan Technology; boundary scan devices; diagnostic tool; virtual test points embedding; Circuit testing; Components, packaging, and manufacturing technology; Electronic equipment testing; Inductance; Integrated circuit packaging; Integrated circuit technology; Semiconductor device packaging; Strontium; System performance; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
WESCON/94. Idea/Microelectronics. Conference Record
Conference_Location
Anaheim , CA
ISSN
1095-791X
Print_ISBN
0-7803-9992-7
Type
conf
DOI
10.1109/WESCON.1994.403543
Filename
403543
Link To Document