DocumentCode :
2935924
Title :
Embedding virtual test points in PCBs
Author :
Chenoweth, David ; Muegge, Mark
Author_Institution :
Quality Semicond. Inc., Santa Clara, CA, USA
fYear :
1994
fDate :
27-29 Sep 1994
Firstpage :
529
Lastpage :
533
Abstract :
Boundary scan is currently the most popular diagnostic tool for high performance systems and plays a key role in overcoming hesitation for using fine pitch packaging. The hands-on test philosophies of the past are transcended with the ability to test a complex circuit internally and externally from a computer terminal. There is a realization that JTAG will quickly pay for itself by reducing the test and integration time. JTAG acceptance continues to increase with the introduction of more boundary scan devices. Major breakthroughs in integrated circuit design, such as Quality Semiconductor´s QuickScan Technology, add endless alternatives for implementing JTAG in a system. QuickScan devices give the designer immediate JTAG coverage without the common performance penalty
Keywords :
automatic testing; boundary scan testing; integrated circuit testing; logic testing; printed circuit testing; IC testing; JTAG coverage; PC testing; PCBs; QuickScan Technology; boundary scan devices; diagnostic tool; virtual test points embedding; Circuit testing; Components, packaging, and manufacturing technology; Electronic equipment testing; Inductance; Integrated circuit packaging; Integrated circuit technology; Semiconductor device packaging; Strontium; System performance; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
WESCON/94. Idea/Microelectronics. Conference Record
Conference_Location :
Anaheim , CA
ISSN :
1095-791X
Print_ISBN :
0-7803-9992-7
Type :
conf
DOI :
10.1109/WESCON.1994.403543
Filename :
403543
Link To Document :
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