• DocumentCode
    2935924
  • Title

    Embedding virtual test points in PCBs

  • Author

    Chenoweth, David ; Muegge, Mark

  • Author_Institution
    Quality Semicond. Inc., Santa Clara, CA, USA
  • fYear
    1994
  • fDate
    27-29 Sep 1994
  • Firstpage
    529
  • Lastpage
    533
  • Abstract
    Boundary scan is currently the most popular diagnostic tool for high performance systems and plays a key role in overcoming hesitation for using fine pitch packaging. The hands-on test philosophies of the past are transcended with the ability to test a complex circuit internally and externally from a computer terminal. There is a realization that JTAG will quickly pay for itself by reducing the test and integration time. JTAG acceptance continues to increase with the introduction of more boundary scan devices. Major breakthroughs in integrated circuit design, such as Quality Semiconductor´s QuickScan Technology, add endless alternatives for implementing JTAG in a system. QuickScan devices give the designer immediate JTAG coverage without the common performance penalty
  • Keywords
    automatic testing; boundary scan testing; integrated circuit testing; logic testing; printed circuit testing; IC testing; JTAG coverage; PC testing; PCBs; QuickScan Technology; boundary scan devices; diagnostic tool; virtual test points embedding; Circuit testing; Components, packaging, and manufacturing technology; Electronic equipment testing; Inductance; Integrated circuit packaging; Integrated circuit technology; Semiconductor device packaging; Strontium; System performance; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    WESCON/94. Idea/Microelectronics. Conference Record
  • Conference_Location
    Anaheim , CA
  • ISSN
    1095-791X
  • Print_ISBN
    0-7803-9992-7
  • Type

    conf

  • DOI
    10.1109/WESCON.1994.403543
  • Filename
    403543