Title :
Correlation of rf-response and domains in patterned ferromagnetic films
Author :
Queitsch, U. ; McCord, J. ; Schaefer, R. ; Schultz, L. ; Rott, K. ; Brueckl, H.
Author_Institution :
IFW Dresden, Dresden
Abstract :
The correlation between rf-response and magnetic microstructure is addressed in this paper. Patterned arrays with rectangular elements of an amorphous Co92Zr2Ta6 (CZT) alloy were fabricated from single layers (thickness 80 nm) and CZT (40 nm)/Al2O3(4 nm)/CZT(40 nm) trilayers. The elements have an induced uniaxial anisotropy along their short axis. The rf-response of the arrays was characterized by pulsed inductive microwave magnetometry and directly compared to the properties of un-patterned films. The corresponding magnetic domain structure was analyzed by quasi-static and picosecond time-resolved wide-field Kerr microscopy in the longitudinal mode.
Keywords :
alumina; amorphous magnetic materials; cobalt alloys; ferromagnetic materials; high-frequency effects; high-speed optical techniques; magnetic anisotropy; magnetic domains; magnetic multilayers; magnetic thin films; magnetometers; optical Kerr effect; tantalum alloys; zirconium alloys; CZT trilayers; Co92Zr2Ta6-Al2O3-Co92Zr2Ta6; amorphous alloy; magnetic domains; magnetic microstructure; patterned ferromagnetic films; picosecond time-resolved wide-field Kerr microscopy; pulsed inductive microwave magnetometry; rf-response; size 4 nm; size 40 nm; size 80 nm; uniaxial anisotropy; Aluminum alloys; Amorphous magnetic materials; Amorphous materials; Anisotropic magnetoresistance; Cobalt alloys; Magnetic domains; Magnetic films; Micromagnetics; Microwave antenna arrays; Zirconium;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.375673
