Structure and magnetism of c-plane-riented Mn50(Te50-xSbx) pseudo-single crystal films

Author

Ashizawa, Y. ; Saito, S. ; Tsunoda, M. ; Takahashi, M.

Author_Institution

Tohoku Univ., Sendai

fYear

2006

fDate

8-12 May 2006

Firstpage

174

Lastpage

174

Abstract

The structure and magnetism and their correlation for the NiAs-type Mn₅₀(Te_50-xSb_x) (NA-MTS) pseudo-single crystal films. The composition of the films was determined by X-ray fluorescence analysis. The crystal structure was investigated by XRD method. The magnetic properties such as saturation magnetic moments, magnetic transition temperatures and saturation magnetization were measured by a SQUID magnetometer. The change of the magnetism in 16lesxles23 cannot connect smoothly with the changes of that in xles16 and in xges33, in particular the sign of inter-atomic-layer exchange coupling. This suggests the possibility that the structural unstability is induced by the magnetic discontinuity.

Keywords

X-ray diffraction; X-ray fluorescence analysis; exchange interactions (electron); magnetic moments; magnetic thin films; magnetic transition temperature; magnetisation; manganese compounds; Mn₅₀Te₅₀Sb; SQUID magnetometer; X-ray fluorescence analysis; XRD; c-plane-oriented pseudosingle crystal films; crystal structure; film composition; interatomic-layer exchange coupling; magnetic discontinuity; magnetic transition temperatures; saturation magnetic moments; saturation magnetization; Fluorescence; Magnetic analysis; Magnetic films; Magnetic moments; Magnetic properties; SQUID magnetometers; Saturation magnetization; Tellurium; Temperature; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2006. INTERMAG 2006. IEEE International

Conference_Location

San Diego, CA

Print_ISBN

1-4244-1479-2

Type

conf

DOI

10.1109/INTMAG.2006.375674

Filename

4261608