Title :
A multilayer magnetic force microscopy tip and comparison of its imaging performance with conventional tips
Author :
Han, G. ; Wu, Y. ; Zheng, Y.
Author_Institution :
Data Storage Inst., Singapore
Abstract :
We present the fabrication and testing of a multilayer coated tip, in which a central thicker ferromagnetic (FM) layer is antiferromagnetically (AFM) coupled with two thinner FM layers at both sides via an ultrathin Ru layer. The performance of the tip is tested by imaging magnetic patterns recorded on longitudinal media. The improvement on spatial resolution and sensitivity is confirmed by comparing the imaging performance with that of conventional tips.
Keywords :
antiferromagnetic materials; ferromagnetic materials; magnetic force microscopy; magnetic multilayers; ruthenium; antiferromagnetic layer; ferromagnetic layer; magnetic patterns imaging; multilayer magnetic force microscopy tip; ultrathin layer; Antiferromagnetic materials; Atomic force microscopy; Coatings; Magnetic force microscopy; Magnetic forces; Magnetic multilayers; Memory; Nanostructures; Spatial resolution; Testing;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.375678
