• DocumentCode
    2936223
  • Title

    Study of rapid cure BGA mold compound on warpage with shadow moire

  • Author

    Wu, Sting ; Han-Hien Shine ; Sting Wu ; Hung, Mike ; Lee, J.J.

  • Author_Institution
    Adv. Semicond. Eng. Inc., Taiwan, China
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    708
  • Lastpage
    713
  • Abstract
    For a plastic package as a whole, more than 70% of package volume is made of plastic material, such as mold compound, solder mask and die attach adhesive. Typically, they are thermosetting materials whose chemo-rheological, exothermic and thermo-mechanical characteristics are highly temperature dependent. PBGA´s asymmetric package design has encountered with a material-and process induced problem during the manufacturing, i.e. warpage. Therefore, analyzing the characteristics of rapid cure mold compound in advance can provide more information for process optimization (warpage control). Some instrument are capable of characterizing these behaviors, for example, Capillary Rheometer (viscosity), DSC (curing condition), TMA (CTE), DMA (visco-elasticity), RVSI (warpage) and shadow moire (real-time warpage changes during reflow). In this study, two materials were firstly compared instrumentally. They are regular and rapid cure mold compounds, i.e., different gelation time. Secondly, process effect on the warpage of packages (35×35 mm with 4-ply substrate) was investigated by RVSI. Finally, the real-time warpage measurement was conducted via shadow moire with simulated surface mount reflow profile
  • Keywords
    ball grid arrays; moire fringes; moulding; plastic packaging; surface mount technology; CTE; DMA; DSC; RVSI; TMA; capillary rheometer; chemorheological characteristics; curing; exothermic characteristics; gelation; plastic BGA package; process optimization; rapid cure mold compound; real-time warpage measurement; shadow moire; surface mount reflow profile; thermomechanical characteristics; thermosetting material; viscoelasticity; viscosity; Curing; Information analysis; Instruments; Manufacturing processes; Microassembly; Plastic packaging; Process control; Temperature dependence; Thermomechanical processes; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-5231-9
  • Type

    conf

  • DOI
    10.1109/ECTC.1999.776257
  • Filename
    776257