• DocumentCode
    293643
  • Title

    VAX/VMS event monitoring and analysis

  • Author

    Buckley, M.F. ; Siewiorek, D.P.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    1995
  • fDate
    27-30 June 1995
  • Firstpage
    414
  • Lastpage
    423
  • Abstract
    Event logs can be used effectively to improve computer system availability. Uses include retrospective and predictive diagnosis; fault management; failure rate estimation; and trend analysis. Unfortunately, much of the research to date has been hampered by the lack of suitable event data, and occasionally by the incorrect interpretation of the available data. This research uses one of the largest sets of data, and the most intensive investigation of the monitoring process conducted to date, to examine event monitoring and analysis. 2.35 million events from 193 VAX/VMS systems covering 335 machine years were used. Examples are presented which show that monitoring deficiencies complicate the analyses, consume additional time, and make incorrect conclusions more likely. For example, incorrect handling of bogus timestamps changes the mean time between groups of events by an order of magnitude. An analysis procedure to identify defects is provided, along with design rules to create better quality logs.<>
  • Keywords
    fault diagnosis; operating systems (computers); software fault tolerance; system monitoring; systems analysis; VAX/VMS event analysis; VAX/VMS event monitoring; computer system availability; design rules; event log; failure rate estimation; fault management; incorrect bogus timestamp handling; incorrect conclusions; monitoring deficiencies; predictive diagnosis; retrospective diagnosis; trend analysis; Availability; Condition monitoring; Cost function; Failure analysis; Fault diagnosis; Hardware; Reliability; Software systems; Statistics; Voice mail;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault-Tolerant Computing, 1995. FTCS-25. Digest of Papers., Twenty-Fifth International Symposium on
  • Conference_Location
    Pasadena, CA, USA
  • Print_ISBN
    0-8186-7079-7
  • Type

    conf

  • DOI
    10.1109/FTCS.1995.466958
  • Filename
    466958