DocumentCode
293644
Title
Synthesizing finite state machines for minimum length synchronizing sequence using partial scan
Author
Ning Jiang ; Chou, R.M. ; Saluja, E.K.
Author_Institution
Mentor Graphics Corp., Warren, NJ, USA
fYear
1995
fDate
27-30 June 1995
Firstpage
41
Lastpage
49
Abstract
The goal is to synthesize an FSM with the objective to minimize the number of scanned flip-flops while requiring a minimum number of system clocks to reach the synchronizable state. An algorithm for selecting state variables for scanning while minimizing the length of the synchronizing sequence based on the reverse-order-search technique is presented. Extra transitions may be required to avoid possible lock-in conditions if the initial state is an invalid state for the machines where the number of states is not a power of 2. Experimental results show that the proposed method guarantees synchronizability and testability through the proper state assignment with reasonable hardware overhead for the benchmark circuits.<>
Keywords
automatic testing; finite state machines; flip-flops; logic testing; search problems; sequential circuits; state assignment; switching functions; synchronisation; FSM; algorithm; benchmark circuits; finite state machine synthesis; hardware overhead; initial state; invalid state; lock-in conditions; minimized scanned flip-flops; minimized system clocks; minimum length synchronizing sequence; partial scan; reverse-order-search technique; scanning; state assignment; state variable selection; synchronizability; synchronizable state; testability; transitions; Automata; Automatic test pattern generation; Automatic testing; Binary decision diagrams; Circuit testing; Computer graphics; Flip-flops; Hardware; Sequential analysis; Synchronization;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault-Tolerant Computing, 1995. FTCS-25. Digest of Papers., Twenty-Fifth International Symposium on
Conference_Location
Pasadena, CA, USA
Print_ISBN
0-8186-7079-7
Type
conf
DOI
10.1109/FTCS.1995.466980
Filename
466980
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