DocumentCode :
2936590
Title :
Handling of highly-moisture sensitive components-an analysis of low-humidity containment and baking schedules
Author :
Shook, R.L. ; Goodelle, J.P.
Author_Institution :
AT&T Bell Labs., Allentown, PA, USA
fYear :
1999
fDate :
1999
Firstpage :
809
Lastpage :
815
Abstract :
Unique component handling issues can arise when an assembly factory uses highly-moisture sensitive surface mount devices (SMDs). This work describes how the distribution of moisture within the molded plastic body of a SMD is an important variable for survivability. JEDEC/IPC moisture level rated packages classified as Levels 4-5a are shown to require additional handling constraints beyond the typical out-of-bag exposure time tracking. Nitrogen or desiccated cabinet containment is shown as a safe and effective means for long-term storage provided the effects of prior out-of-bag exposure conditions are taken into account. Moisture diffusion analyses coupled with experimental verification studies show that time in storage is as important a variable as floor-life exposure for highly-moisture sensitive devices. Improvements in floor-life survivability can be obtained by a handling procedure that includes cyclic storage in low humidity containment. SMDs that have exceeded their floor-life limits are analyzed for proper baking schedules. Optimized baking schedules can be adopted depending on a knowledge of the exposure conditions and the moisture sensitivity level of the device
Keywords :
diffusion; environmental degradation; integrated circuit packaging; moisture; surface mount technology; component handling; dry storage; floor life survivability; high temperature baking; low humidity containment; moisture diffusion; moisture sensitivity; surface mount device; Additives; Assembly; Humidity; Moisture; Nitrogen; Plastic packaging; Production facilities; Semiconductor device modeling; Temperature sensors; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-5231-9
Type :
conf
DOI :
10.1109/ECTC.1999.776275
Filename :
776275
Link To Document :
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