Title :
Thin-film cryogenic current comparator
Author :
Seppa, H. ; Satrapinski, A. ; Kiviranta, M. ; Virkki, V.
Author_Institution :
VTT Autom. Measure. & Technol., Espoo, Finland
Abstract :
We analyse a thin-film cryogenic current comparator (CCC) intended to be used in ac measurements. Our analysis shows that calibrating the dc ratio error of the thin-film CCC against a conventional CCC, it can be used up to 10 kHz as a sensitive and highly accurate current comparator. We have fabricated a practical 1:1 planar CCC integrated with a low-noise SQUID magnetometer.
Keywords :
SQUID magnetometers; bridge circuits; calibration; current comparators; electric current measurement; electric resistance measurement; measurement errors; measurement standards; thin film devices; 10 kHz; AC measurements; AC resistance bridge; DC ratio error; calibration; highly accurate current comparator; low-noise SQUID magnetometer integration; planar comparator; thin-film cryogenic current comparator; Cryogenics; Current measurement; Electrical resistance measurement; Frequency; Inductance; Metrology; Resonance; Superconducting coils; Temperature dependence; Transistors;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699835
