DocumentCode :
2938045
Title :
Wideband in-situ soil permittivity coaxial probe
Author :
Chen, Ming ; Chen, Chi-Chih
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
fYear :
2011
fDate :
3-8 July 2011
Firstpage :
346
Lastpage :
349
Abstract :
A novel probe design form measuring complex permittivity of soils in-situ from 10 to 1000 MHz and above without taking soil samples is presented. The dielectric constant and conudctivity of soil is derived from step-frequency reflection taken inside a small (1~2 inches) freshly bored holes. As a result, permittivity at various depths from surface with in-situ moisture content and soil texture can be obtained in the fields. A novel calibration method was developed to account for the frequency-dependent geometrical factor which causes bias errors in conventional calibration methods. This paper will discuss about the novel probe design and calibration method based on numerical simulation data. We will present the fabricated instrument and measurement examples during the conference.
Keywords :
calibration; geometry; numerical analysis; permittivity; probes; soil; calibration method; complex permittivity measurement; dielectric constant; frequency-dependent geometrical factor; in-situ moisture content; numerical simulation; soil conductivity; soil texture; wideband in-situ soil permittivity coaxial probe; Calibration; Materials; Permittivity; Permittivity measurement; Probes; Soil; Soil measurements; Coaxial probe; Dielectric probe; Permittivity measurement; Vector network analyzer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation (APSURSI), 2011 IEEE International Symposium on
Conference_Location :
Spokane, WA
ISSN :
1522-3965
Print_ISBN :
978-1-4244-9562-7
Type :
conf
DOI :
10.1109/APS.2011.5996714
Filename :
5996714
Link To Document :
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