The way of the disturbance injection for simulating the frequency response of the intrinsic immunity of naked integrated circuits

To simulate the conducted radio frequency immunity, shortened `immunity´, of integrated circuit (ICs) requires the knowledge on the transfer coefficient of the propagation network for the disturbance and the intrinsic response of the on-chip transistor circuits to the disturbance directly on the circuit. This paper intends to find the correct simulation test bench to extract the intrinsic response of the on-chip circuits. The emphasis is the suitable disturbance injection networks (DIN) which couples the disturbance into the circuit and at the same time does not changes the immunity of the circuit. The oscillator circuit is selected as the device under test (DUT). Two immunity models with different DIN configurations are simulated. Their results are compared. The comparison reveals that the intrinsic frequency immunity of an IC depends on not only on the disturbance on the IC but also the configuration of DIN. The model of the IC itself is not sufficient for extracting the intrinsic immunity.