Title :
Transient Circuit Analysis Of High Performance Infrared Focal Plane Readout Devices
Author :
Gal, G. ; Winarske, T.P. ; Hawkins, S.R.
Author_Institution :
Lockheed Research & Development Division
Keywords :
Circuit analysis; Cryogenics; Design automation; Detectors; Infrared sensors; MOSFET circuits; Optical arrays; Optical buffering; Sensor arrays; Transient analysis;
Conference_Titel :
Circuits, Systems and Computers, 1985. Nineteeth Asilomar Conference on
Conference_Location :
Pacific Grove, CA,USA
Print_ISBN :
0-8186-0729-7
DOI :
10.1109/ACSSC.1985.671519