Research on electromagnetic compatibility test port model of smart high voltage equipment

Author

Yiyong Liu ; Wenzhu Ren ; Jianqiang Feng ; Xinmin Hu

Author_Institution

Xi´an High Voltage Apparatus Res. Inst. Co. Ltd., Xian, China

fYear

2012

fDate

6-9 Nov. 2012

Firstpage

381

Lastpage

383

Abstract

Smart high voltage equipment (SHVE) is a core device for constructing the smart grid and the intelligent electronic device (IED) is a basic unit of SHVE, so the electromagnetic compatibility (EMC) of IED reveals the SHVE-EMC. From this point, this paper defines IED-EMC test models based on test ports concept. Four factors are put forward in order to ensure the validity of the IED-EMC test, and a discussion about conditions between carrying out the type test and the site test is provided. Finally, a suggestion for perfecting the test items is given to guarantee the integrity of the IED-EMC test based on a comparison between the IED-EMC test model and company standard of state grid corporation of China.

Keywords

electromagnetic compatibility; high-voltage engineering; power apparatus; smart power grids; IED; electromagnetic compatibility test port model; intelligent electronic device; smart grid; smart high voltage equipment; test model; Electromagnetic compatibility; Electromagnetic interference; Magnetic fields; Ports (Computers); Radio frequency; Standards; Voltage measurement; electromagnetic compatibility; intelligent electronic device; smart high voltage equipment; test model; test port;

fLanguage

English

Publisher

ieee

Conference_Titel

Environmental Electromagnetics (CEEM), 2012 6th Asia-Pacific Conference on

Conference_Location

Shanghai

Print_ISBN

978-1-4673-0030-8

Type

conf

DOI

10.1109/CEEM.2012.6410648

Filename

6410648