Title :
Radiation damage of pure and doped KMgF3 crystals
Author :
Gektin, A.V. ; Komar, V.K. ; Shiran, N.V. ; Shlykhturov, V.V. ; Nesterenko, N.P. ; Krasovitskaya, I.M. ; Kornienko, V.V.
Author_Institution :
Inst. for Single Crystals, Acad. of Sci., Kharkov, Ukraine
fDate :
30 Oct-5 Nov 1994
Abstract :
The radiation damage nature of pure and doped KMgF3 crystals was studied on the basis of the absorption emission excitation and thermoluminescence (TL) spectra. It is shown that the sensitivity of this material to the ionizing irradiation is defined not only own color centers but by the presence of oxygen impurities too. The availability of oxygen in KMgF3 is revealed in additional absorption and emission bands, high temperature (T>400°C) peaks of TL, UV-energy storage. From the RE doped KMgF3 crystals the most illustrative results were obtained for EuF3 and Eu2O3 doped samples. High emission efficiency corresponds to the f-f transitions in Eu2+ ions and trap´s structure is connected as with intrinsic point defects as with oxygen impurity contents. The most intensive TL-peak is at 390°C and in crystals with Eu2O3 it´s in many times higher than in those with EuF3. It is shown that KMgF3:Eu2O3 is an effective dosimeter not only for X-ray but for UV-registration too
Keywords :
F-centres; X-ray effects; magnesium compounds; potassium compounds; thermoluminescence; thermoluminescent dosimeters; ultraviolet spectra; 20 to 650 C; KMgF3 crystals; KMgF3:Eu2O3; KMgF3:EuF3; UV-registration; X-ray registration; absorption bands; absorption emission excitation; color centers; dosimeter; emission bands; emission efficiency; f-f transitions; intrinsic point defects; ionizing irradiation; radiation damage nature; thermoluminescence spectra; Availability; Crystalline materials; Crystals; Electromagnetic wave absorption; Impurities; Luminescence; Optical materials; Solid lasers; Temperature sensors; X-ray lasers;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record
Conference_Location :
Norfolk, VA
Print_ISBN :
0-7803-2544-3
DOI :
10.1109/NSSMIC.1994.474381
