• DocumentCode
    293882
  • Title

    The University of Pennsylvania integrated circuit design environment

  • Author

    Ekenberg, Tor

  • Author_Institution
    Dept. of Phys., Pennsylvania Univ., Philadelphia, PA, USA
  • Volume
    1
  • fYear
    1994
  • fDate
    30 Oct-5 Nov 1994
  • Firstpage
    25
  • Abstract
    Over the last few years the High Energy Engineering Group at the University of Pennsylvania have successfully designed and fabricated a number of large analog and mixed analog/digital ICs. Most of these ICs have been fabricated in the 2.0 and 1.2 micron processes available through MOSIS, but some have gone directly to foundries like AT&T, UTMC, and IBM. In order to carry out this ambitious design effort a significant amount of time have been spent on developing and maintaining a full-custom and standard cell design environment at Penn. This environment currently consists of a fully characterized 50 leaf cell scalable standard cell library integrated with the Verilog simulator with back-annotation, as well as all the tools to design full custom analog and mixed signal ICs. Emphasis has been placed on full-chip post-layout simulations as well as other physical design verification techniques which yield a high first pass success rate. This payer will describe the design framework at Penn which allows a complete design process from conceptual design and high level behavioral simulation all the way through final post-layout simulations. The joint Penn/Cadence standard cell characterization effort will also be described
  • Keywords
    detector circuits; integrated circuit design; nuclear electronics; MOSIS; University of Pennsylvania integrated circuit design environment; Verilog simulator; analog ICs; back-annotation; design verification; final post-layout simulations; full-chip post-layout simulations; fully characterized 50 leaf cell scalable standard cell library; high level behavioral simulation; mixed analog/digital ICs; Detectors; Hardware design languages; Integrated circuit layout; Integrated circuit synthesis; Integrated circuit testing; Process design; Signal design; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record
  • Conference_Location
    Norfolk, VA
  • Print_ISBN
    0-7803-2544-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1994.474399
  • Filename
    474399