DocumentCode :
293911
Title :
Electrical characterization and detection performances of various semi-insulating GaAs crystals for low energy X-rays
Author :
Bertolucci, E. ; Bottigli, U. ; Cola, Adriano ; Fantacci, M.E. ; Stefanini, A. ; Vasanelli, Lorenzo
Author_Institution :
Dipartimento di Fisica, Pisa Univ., Italy
Volume :
1
fYear :
1994
fDate :
30 Oct-5 Nov 1994
Firstpage :
188
Abstract :
In order to investigate the correlation between time electrical characteristics of the semi-insulating GaAs and its properties as a possible detector for low energy X-rays, we have measured, for various materials, the forward and the reverse I-V characteristic, the capacitance as a function of the frequency at various bias voltages and the capacitance as a function of the bias voltages at various frequencies. To measure the charge collection efficiency, the energy resolution and the detection efficiency as a function of the bias voltage the crystals have been irradiated with 22, 60, 88 and 122 keV photons. The results are discussed and a comparison between materials from various factories, of different thickness and equipped with different contacts is also presented
Keywords :
X-ray detection; capacitance; gallium arsenide; semiconductor counters; 122 keV; 22 keV; 60 keV; 88 keV; GaAs; bias voltages; capacitance; charge collection efficiency; contacts; detection efficiency; energy resolution; forward I-V characteristic; frequencies; low energy X-ray detection; reverse I-V characteristic; semi-insulating GaAs crystals; time electrical characteristics; Capacitance measurement; Electric variables; Electric variables measurement; Energy measurement; Frequency measurement; Gallium arsenide; Photonic crystals; Voltage; X-ray detection; X-ray detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record
Conference_Location :
Norfolk, VA
Print_ISBN :
0-7803-2544-3
Type :
conf
DOI :
10.1109/NSSMIC.1994.474430
Filename :
474430
Link To Document :
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