• DocumentCode
    2939422
  • Title

    Transition curvature analysis for high TPI applications

  • Author

    Che, X. ; Kim, N.

  • Author_Institution
    Samsung Inf. Syst. America, San Jose
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    347
  • Lastpage
    347
  • Abstract
    This paper attempts to directly measure transition width and curvature based on a simple 2D transition model. The foundation of this approach is reciprocity principle and linear superposition of playback process.
  • Keywords
    perpendicular magnetic recording; 2D transition offtrack profile model; perpendicular recording; playback process linear superposition; reciprocity principle; transition width; Density measurement; Fabrication; Frequency; Information systems; Magnetic heads; Mathematical model; Metrology; Narrowband; Perpendicular magnetic recording; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.376071
  • Filename
    4261780
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2939422