DocumentCode
293944
Title
HgI2 PSD for X- and γ-ray spectrometry
Author
Dusi, W. ; Caroli, E. ; Donati, A. ; Olivieri, C. ; Ramunno, G. ; Grassi, D. ; Perillo, E. ; Spadaccini, G. ; Amann, M. ; Koebel, J.M. ; Siffert, P.
Author_Institution
Istituto TESRE, CNR, Bologna, Italy
Volume
2
fYear
1994
fDate
30 Oct-5 Nov 1994
Firstpage
847
Abstract
A HgI2 microstrip two-dimensional array with total area of 10×10 mm2 and a thickness of 0.5 mm has been tested. By using a coincidence-anticoincidence technique the effective pixel area has been identified and spectroscopic performance and some indications about the spatial resolution have been extracted. Values like 25% (FWHM) at 6 keV and 7% at 32 keV for the energy resolution have been obtained. For X-ray energies as high as 80 keV the presence of an intense lateral diffusion of the produced charge does not allow finding the impact position of the incident radiation by a simple digital readout of the strip pulses
Keywords
X-ray detection; X-ray spectrometers; coincidence techniques; gamma-ray detection; gamma-ray spectrometers; mercury compounds; position sensitive particle detectors; semiconductor counters; 0.5 mm; 32 keV; 6 keV; 80 keV; HgI2 PSD γ-ray spectrometry; HgI2 PSD X-ray spectrometry; HgI2 microstrip two-dimensional array; X-ray energies; coincidence-anticoincidence technique; digital readout; effective pixel area; impact position; incident radiation; intense lateral diffusion; spatial resolution; spectroscopic performance; strip pulses; Crystalline materials; Face detection; Gamma ray detection; Gamma ray detectors; Microstrip antenna arrays; Phased arrays; Spatial resolution; Spectroscopy; Strips; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record
Conference_Location
Norfolk, VA
Print_ISBN
0-7803-2544-3
Type
conf
DOI
10.1109/NSSMIC.1994.474482
Filename
474482
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