A semi-empirical method for predicting single event upset rates: current technology applications

Author

Gates, Michele M.

Author_Institution

Maryland Univ., College Park, MD, USA

Volume

3

fYear

1997

fDate

1-8 Feb 1997

Firstpage

457

Abstract

This paper presents systems engineering approach to the prediction of single event upset (SEU) rates due to direct ionization. The Device-Mission System will be introduced and applications be presented. Results of predictions performed for the Hitachi 1 Mbit SRAM currently onboard the Cosmic Ray Upset Experiment (CRUX) based on flight lot experimental test data will be compared to flight data. Addition, results for three CRUX SRAMs compared with flight data and with results of other SEU prediction methods performed using the same input of generic test data set and environment spectra

Keywords

SRAM chips; aerospace computing; aerospace simulation; aerospace testing; ion beam effects; radiation hardening (electronics); special purpose computers; 1 Mbit; COTS parts; Cosmic Ray Upset Experiment; Device-Mission System; SEU rates prediction; SRAM; direct ionization; environment spectra; flight data; generic test data set; heavy ion environment; semi-empirical method; systems engineering approach; Azimuthal angle; Differential equations; Educational institutions; Integral equations; Low earth orbit satellites; Paper technology; Performance evaluation; Random access memory; Single event upset; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Aerospace Conference, 1997. Proceedings., IEEE

Conference_Location

Snowmass at Aspen, CO

Print_ISBN

0-7803-3741-7

Type

conf

DOI

10.1109/AERO.1997.574902

Filename

574902