Title :
A 28 nm standard CMOS watt-level power amplifier for LTE applications
Author :
Fuhrmann, Jorg ; Obmann, Patrick ; Dufrene, Krysztof ; Pretl, Harald ; Weigel, Robert
Author_Institution :
Friedrich-Alexander-Univ. Erlangen-Nuremberg, Erlangen, Germany
Abstract :
In this paper, a 28nm radio frequency (RF) complementary metal-oxide-semiconductor (CMOS) power amplifier (PA) is presented. It was designed to meet 3GPP TS 36.101 V10.10.0 requirements for Long Term Evolution (LTE). The design was tested on board and has full onchip matching. Furthermore, the biasing for class-AB is also implemented on chip. The maximum gain is more than 15 dB until 0dBm input power. It achieves a power added efficiency (PAE) of 35.2 %, a drain efficiency (DE) of 39.5% and a maximum output power Pmax of 31.7dBm at a frequency of 1.83 GHz. The adjacent channel leakage power ratio (ACLR) for the evolved universal terrestrial radio access (E-UTRA) measured for full allocated LTE15 PUSCH are for the lower band 33.2 dBc and for the upper band 33.2 dBc. The UTRAACLR for the lower and upper band is 36.2 dBc and 35.1 dBc, respectively. The Error Vector Magnitude (EVM) is 4.8% for a quadrature phase-shift keying (QPSK) and 3.8% for a 16 quadrature amplitude modulation (16QAM) signal.
Keywords :
CMOS analogue integrated circuits; Long Term Evolution; UHF integrated circuits; UHF power amplifiers; quadrature amplitude modulation; quadrature phase shift keying; radio access networks; 16 quadrature amplitude modulation signal; 16QAM; ACLR; DE; E-UTRA; EVM; LTE15 PUSCH; PAE; QPSK; RF PA; adjacent channel leakage power ratio; class-AB; drain efficiency; efficiency 35.2 percent; efficiency 39.2 percent; error vector magnitude; evolved universal terrestrial radio access; frequency 1.83 GHz; long term evolution; on-chip matching; power added efficiency; quadrature phase-shift keying; radiofrequency complementary metal-oxide-semiconductor; size 28 nm; standard CMOS watt-level power amplifier; CMOS integrated circuits; Frequency measurement; Impedance matching; Phase shift keying; Power generation; Semiconductor device measurement; Transistors; 3GPP Handset; CMOS 28 nm; Differential; LTE; Power Amplifier; Stacked Design; Watt-Level;
Conference_Titel :
Power Amplifiers for Wireless and Radio Applications (PAWR), 2015 IEEE Topical Conference on
Conference_Location :
San Diego, CA
DOI :
10.1109/PAWR.2015.7139205