DocumentCode
293956
Title
HX2: a 16-channel charge amplifier IC for the read-out of X-ray detectors
Author
Thomas, S.L. ; Seller, P. ; Sharp, P H
Author_Institution
Rutherford Appleton Lab., Chilton, UK
Volume
2
fYear
1994
fDate
30 Oct-5 Nov 1994
Firstpage
774
Abstract
RAL Microelectronics Group has developed a 16-channel multiplexed charge amplifier IC (HX2) for the read-out of Cadmium Telluride X-ray detectors. The IC has been incorporated into a prototype X-ray imaging system intended for non-destructive production line monitoring. The HX2 contains an array of 16 integrating amplifiers, each with a 10 pF feedback capacitor, and a dynamic range of 20 pC. The integration period can be varied over the range ~5 μs to ~100 ms. In order to extend its range of applications, HX2 was designed with two modes of operation. In the first mode, the integration period is followed by the read-out period where the 16 channels are multiplexed onto an analogue output bus. The next integration period starts when this read-out has finished. In the second mode, the read-out of the voltages from one integration period takes place during the subsequent integration period. This overlapping of integration and readout periods reduces the dead time of the HX2. The IC has a high signal-to-noise ratio (typically above 10000:1), and is suitable for the high-resolution read-out of other detector systems, such as photodiode arrays. The dual-mode operation allows it to work with detectors producing either continuous or pulsed currents
Keywords
X-ray detection; amplifiers; cadmium compounds; detector circuits; nuclear electronics; semiconductor counters; 10 pF feedback capacitor; 16-channel multiplexed charge amplifier IC; CdTe X-ray detector readout; HX2; analogue output bus; continuous currents; dead time; dual-mode operation; dynamic range; integrating amplifiers; integration period; modes of operation; next integration period; nondestructive production line monitoring; photodiode arrays; prototype X-ray imaging system; pulsed currents; signal-to-noise ratio; Cadmium compounds; Capacitors; Dynamic range; Feedback; Microelectronics; Monitoring; Production systems; Prototypes; X-ray detectors; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record
Conference_Location
Norfolk, VA
Print_ISBN
0-7803-2544-3
Type
conf
DOI
10.1109/NSSMIC.1994.474496
Filename
474496
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