DocumentCode :
293965
Title :
A 128-channel digital pipeline chip for silicon strip detector read-out
Author :
Witt, Joel De
Author_Institution :
Inst. for Particle Phys., California Univ., Santa Cruz, CA, USA
Volume :
2
fYear :
1994
fDate :
30 Oct-5 Nov 1994
Firstpage :
732
Abstract :
A digital VLSI device for silicon-strip detector read-out has been developed which supports 128 channels as well as providing amplifier calibration signals. This device provides buffering for 256 machine cycles of the hit-pattern of the strips as sensed by multi-channel amplifier/discriminator chips. A second-level buffer is provided. Testability, and alignment features are also provided. The device has been manufactured in a radiation hardened CMOS process. The power demand is 0.21 mW per channel at normal operating conditions. Maximum operating frequency is above 60 MHz. Layout takes into consideration detector geometry, so that mosaic placement of chips can be used to provide electronics pitch no larger than detector strip pitch, down to 45 microns. Serial control and read-out is implemented, to allow optical fiber communication with the controller. Use of dual-ported RAM for the pipeline implementation provides zero-dead-time acquisition. Signal levels to and from the chip are minimized for low noise operation
Keywords :
CMOS digital integrated circuits; VLSI; detector circuits; high energy physics instrumentation computing; nuclear electronics; optical interconnections; pipeline processing; position sensitive particle detectors; silicon radiation detectors; Si; amplifier calibration signals; detector geometry; detector strip pitch; digital VLSI device; digital pipeline chip; dual-ported RAM; electronics pitch; low noise operation; multi-channel amplifier chips; multi-channel discriminator chips; optical fiber communication; pipeline implementation; radiation hardened CMOS process; second-level buffer; silicon strip detector read-out; zero-dead-time acquisition; Calibration; Communication system control; Detectors; Optical amplifiers; Optical control; Pipelines; Silicon; Strips; Testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record
Conference_Location :
Norfolk, VA
Print_ISBN :
0-7803-2544-3
Type :
conf
DOI :
10.1109/NSSMIC.1994.474506
Filename :
474506
Link To Document :
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