A 772Mbit/s 8.81bit/nJ 90nm CMOS soft-input soft-output sphere decoder

Author

Borlenghi, Filippo ; Witte, Ernst Martin ; Ascheid, Gerd ; Meyr, Heinrich ; Burg, Andreas

Author_Institution

Inst. for Commun. Technol. & Embedded Syst., RWTH Aachen Univ., Aachen, Germany

fYear

2011

fDate

14-16 Nov. 2011

Firstpage

297

Lastpage

300

Abstract

Multiple-input multiple-output (MIMO) wireless transmission can approach its full potential in terms of spectral efficiency only with iterative decoding, i.e., by exchanging soft information between the MIMO detector and the channel decoder. Solving the soft-input soft-output (SISO) MIMO detection problem entails a very high complexity, which can typically be reduced only at the cost of a communication-performance penalty. The single tree-search (STS) sphere-decoding (SD) algorithm covers a wide range of this complexity-performance tradeoff. In this paper, we describe the silicon implementation of SISO STS SD. The 90 nm CMOS ASIC operates at a lower signal-to-noise ratio than other MIMO detectors. The maximum throughput is 772 Mbit/s at an energy efficiency of 8.81 bit/nJ.

Keywords

CMOS integrated circuits; MIMO communication; application specific integrated circuits; channel coding; elemental semiconductors; iterative decoding; signal detection; silicon; tree searching; CMOS ASIC; CMOS soft-input soft-output sphere decoder; MIMO detector; MIMO wireless transmission; SISO MIMO detection problem; SISO STS SD; STS SD algorithm; bit rate 772 Mbit/s; channel decoder; complexity-performance tradeoff; energy efficiency; iterative decoding; multiple-input multiple-output wireless transmission; signal-to-noise ratio; silicon implementation; single-tree search sphere decoding algorithm; size 90 nm; soft-input soft-output MIMO detection problem; spectral efficiency; Antennas; Application specific integrated circuits; Complexity theory; Detectors; MIMO; Measurement; Signal to noise ratio;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid State Circuits Conference (A-SSCC), 2011 IEEE Asian

Conference_Location

Jeju

Print_ISBN

978-1-4577-1784-0

Type

conf

DOI

10.1109/ASSCC.2011.6123571

Filename

6123571