• DocumentCode
    2940356
  • Title

    Spin Transfer Switching in sub-100nm Magnetic Tunnel Junctions

  • Author

    Assefa, S. ; Sun, J.Z. ; Ruiz, N. ; Worledge, D.C. ; Gallagher, W.J. ; Nagamine, Y. ; Djayaprawira, D.D. ; Watanabe, N.

  • Author_Institution
    IBM Watson Res. Center, Yorktown Heights
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    402
  • Lastpage
    402
  • Abstract
    When injected spin polarized electrons interact with the magnetic moment of a free layer, their angular momentum becomes transferred to the free layer. If sufficient current is applied, the exerted torque switches the free layer either parallel or anti-parallel to the pinned layer depending on the direction of flow of the current. This type of localized current switching is attractive for an MRAM application. This paper focuses on the fabrication and characterization of sub-100nm spin-transfer switching devices. These fabricated tunnel junctions were characterized at room temperature with a quasi-static electrical measurement setup.
  • Keywords
    electron spin polarisation; magnetic moments; magnetic storage; magnetic switching; magnetic tunnelling; angular momentum; localized current switching; magnetic moment; magnetic tunnel junctions; pinned layer; quasi-static electrical measurement; room temperature; size 100 nm; spin polarized electrons; spin transfer switching; temperature 293 K to 298 K; Charge carrier processes; Electric variables measurement; Fabrication; Magnetic moments; Magnetic switching; Magnetic tunneling; Polarization; Switches; Temperature; Torque;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.376126
  • Filename
    4261835