DocumentCode :
2940356
Title :
Spin Transfer Switching in sub-100nm Magnetic Tunnel Junctions
Author :
Assefa, S. ; Sun, J.Z. ; Ruiz, N. ; Worledge, D.C. ; Gallagher, W.J. ; Nagamine, Y. ; Djayaprawira, D.D. ; Watanabe, N.
Author_Institution :
IBM Watson Res. Center, Yorktown Heights
fYear :
2006
fDate :
8-12 May 2006
Firstpage :
402
Lastpage :
402
Abstract :
When injected spin polarized electrons interact with the magnetic moment of a free layer, their angular momentum becomes transferred to the free layer. If sufficient current is applied, the exerted torque switches the free layer either parallel or anti-parallel to the pinned layer depending on the direction of flow of the current. This type of localized current switching is attractive for an MRAM application. This paper focuses on the fabrication and characterization of sub-100nm spin-transfer switching devices. These fabricated tunnel junctions were characterized at room temperature with a quasi-static electrical measurement setup.
Keywords :
electron spin polarisation; magnetic moments; magnetic storage; magnetic switching; magnetic tunnelling; angular momentum; localized current switching; magnetic moment; magnetic tunnel junctions; pinned layer; quasi-static electrical measurement; room temperature; size 100 nm; spin polarized electrons; spin transfer switching; temperature 293 K to 298 K; Charge carrier processes; Electric variables measurement; Fabrication; Magnetic moments; Magnetic switching; Magnetic tunneling; Polarization; Switches; Temperature; Torque;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
Type :
conf
DOI :
10.1109/INTMAG.2006.376126
Filename :
4261835
Link To Document :
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