• DocumentCode
    2940370
  • Title

    Finite size effects on the exchange bias properties of ferromagnetic/antiferromagnetic bilayers

  • Author

    Baltz, V. ; Sort, J. ; Bollero, A. ; Landis, S. ; Rodmacq, B. ; Dieny, B.

  • Author_Institution
    SPINTEC, Grenoble
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    403
  • Lastpage
    403
  • Abstract
    Exchange bias (EB) refers to the shift of the hysteresis loop, typically observed in exchange interacting ferromagnetic (FM)-antiferromagnetic (AFM) materials. During the last decades, EB properties have been extensively investigated, mainly in thin films, due to their technological applications in magnetic random access memories and magnetoresistive read heads based on spin valves or tunnel junctions. Recently, the drastic increase in the areal density of magnetic recording media has motivated the study of EB properties in systems of reduced lateral dimensions. The reduction of the lateral dimensions of an EB system down to length scales comparable to the FM or to the AFM magnetic domain sizes is also interesting from a fundamental point of view since this results in a confinement and subsequent alteration of the FM and AFM domain structures, hence allowing to probe the role of domains on EB.
  • Keywords
    antiferromagnetic materials; ferromagnetic materials; interface magnetism; magnetic hysteresis; magnetic thin films; domain structures; exchange bias properties; ferromagnetic-antiferromagnetic materials; ferromagnetic/antiferromagnetic bilayers; finite size effects; hysteresis loop; magnetic domain sizes; magnetic random access memories; magnetic recording media; magnetoresistive read heads; spin valves; thin films; tunnel junctions; Antiferromagnetic materials; Magnetic films; Magnetic heads; Magnetic hysteresis; Magnetic materials; Magnetic properties; Magnetic recording; Random access memory; Spin valves; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.376127
  • Filename
    4261836