Title :
Projection data de-truncation in direct asymmetric-fan-beam SPECT reconstruction
Author :
Loncaric, Srecko ; Chang, Wei ; Huang, Gang
Author_Institution :
Rush Presbyterian-St. Luke´´s Med. Cente, Chicago, IL, USA
fDate :
30 Oct-5 Nov 1994
Abstract :
The authors have recently developed a new sampling geometry-asymmetric fan (AsF) beam-which completes sampling of the imaging field of view (FOV), and thereby avoids the problems caused by projection truncation in transmission imaging with SPECT systems. The AsF geometry for a particular angular view covers only a half of the FOV. The problem in the raw projection data is that a sharp cut-off that causes spurious oscillations within the central region of a reconstructed image. But, since the 360° acquisition provides complete sampling, each individual projection can be completed by the proper use of the opposing views data. Several methods were investigated to prepare the data for filtering and backprojection. The first approach was the simplest one, using just the mirror reflection of original data; `fooling´ the Fourier transform. The second one was the use of the single opposing projection, the one separated by the 180°, without any processing. The last one, yielding the best results, provides missing data by resorting and interpolation. It uses four projection bins, two from each of the two neighboring angular views, that do not exactly oppose the original projection
Keywords :
image reconstruction; medical image processing; single photon emission computed tomography; Fourier transform; direct asymmetric-fan-beam SPECT reconstruction; interpolation; medical diagnostic imaging; neighboring angular views; nuclear medicine; opposing views data; projection bins; projection data detruncation; sampling geometry; Attenuation; Biomedical imaging; Collimators; Detectors; Geometry; Image reconstruction; Image sampling; Interpolation; Sampling methods; Transmission line measurements;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record
Conference_Location :
Norfolk, VA
Print_ISBN :
0-7803-2544-3
DOI :
10.1109/NSSMIC.1994.474601