DocumentCode :
2940450
Title :
Frequency stabilization of a Nd:YAG laser to Doppler-broadened lines of iodine near 532 nm
Author :
Cao Hongjun ; Zang Er Jun ; Zhao Kun ; Zhang Xuebin ; Wu Yaoxiang ; Shen Naicheng
Author_Institution :
Dept. of Quantum, Nat. Inst. of Metrol., Beijing, China
fYear :
1998
fDate :
6-10 July 1998
Firstpage :
183
Lastpage :
184
Abstract :
Diode-pumped Nd:YAG lasers are promising sources of the new optical frequency standards at 532 nm that were recommended recently in the 9th CCDM. Molecular iodine has several strong absorption lines at the second harmonic of Nd:YAG laser near 532 nm, thus providing an absolute reference for frequency stabilization. In general, the 532 nm laser sources used in iodine-stabilized systems are commercial monolithic lasers, which are compact, efficient, and reliable, but are also expensive and complicated. Recently, we have frequency stabilized a self-developed single-frequency Nd:YAG-KTP laser to the Doppler-broadened (instead of Doppler-free) lines of iodine. That was the first time to stabilize a 532 nm laser to an absolute reference in China. Due to its concise structure, low cost, and the ability to resist more disturbance, the laser system is attractive in some certain industrial applications that require an absolute frequency reference but not very high stability.
Keywords :
Doppler broadening; frequency standards; iodine; laser frequency stability; neodymium; optical harmonic generation; solid lasers; 532 nm; Doppler-broadened lines; I/sub 2/; YAG:Nd; YAl5O12:Nd; absolute frequency reference; diode-pumped Nd:YAG laser; first harmonic method; frequency stabilization; green laser; intracavity doubled output; iodine-stabilized systems; low cost; optical frequency standards; self-developed single-frequency Nd:YAG-KTP laser; Absorption; Diodes; Frequency; Laser beam cutting; Laser stability; Laser transitions; Laser tuning; Lasers and electrooptics; Power harmonic filters; Temperature control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
Type :
conf
DOI :
10.1109/CPEM.1998.699849
Filename :
699849
Link To Document :
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