DocumentCode :
2940697
Title :
A 35 fJ 10b 160 MS/s pipelined-SAR ADC with decoupled flip-around MDAC and self-embedded offset cancellation
Author :
Zhu, Yan ; Chan, Chi-Hang ; Sin, Sai-Weng ; Seng-Pan, U. ; Martins, R.P. ; Maloberti, Franco
Author_Institution :
State-Key Lab. of Analog & Mixed Signal VLSI, Univ. of Macau, Macao, China
fYear :
2011
fDate :
14-16 Nov. 2011
Firstpage :
61
Lastpage :
64
Abstract :
A Time-Interleaved (TI) pipelined-SAR ADC with on-chip offset cancellation technique is presented. The design reuses the SAR ADC to perform offset cancellation, which significantly saves calibration area, power and time. A 6 bit capacitive DAC is built as a flip-around MDAC for low inter-stage gain implementation. The capacitive attenuation solutions in both 1st and 2nd DACs minimize the power dissipation and optimize conversion speed. Measurements of a 65nm CMOS prototype operating at 160MS/s and 1.1V supply show 2.72mW total power consumption. The SNDR is 55.4dB and the FoM as low as 35fJ/conv.-step.
Keywords :
CMOS integrated circuits; analogue-digital conversion; digital-analogue conversion; CMOS prototype; capacitive attenuation; decoupled flip-around MDAC; energy 35 fJ; low inter-stage gain; power dissipation; self-embedded offset cancellation; size 65 nm; time-interleaved pipelined-SAR ADC; voltage 1.1 V; voltage 2.72 mV; word length 10 bit; word length 6 bit; Accuracy; Arrays; CMOS integrated circuits; Calibration; Capacitance; Capacitors; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference (A-SSCC), 2011 IEEE Asian
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-1784-0
Type :
conf
DOI :
10.1109/ASSCC.2011.6123604
Filename :
6123604
Link To Document :
بازگشت