DocumentCode :
2940707
Title :
A 10b Ternary SAR ADC with decision time quantization based redundancy
Author :
Guerber, Jon ; Gande, Manideep ; Venkatram, Hariprasath ; Waters, Allen ; Moon, Un-Ku
Author_Institution :
Sch. of EECS, Oregon State Univ., Corvallis, OR, USA
fYear :
2011
fDate :
14-16 Nov. 2011
Firstpage :
65
Lastpage :
68
Abstract :
The design of a Ternary Successive Approximation ADC (TSAR) with decision time quantization is proposed. The TSAR examines the transient information of the typical SAR comparator to provide full half-bit redundancy, an increased monotonicity switching algorithm, speed enhancements without inherent metastability, residue shaping effects, and stage skipping. A prototype is fabricated in 0.13μm CMOS employing on-chip statistical time reference calibration and supply variability from 0.8 to 1.2V. The chip consumes 84μW at 8 MHz for a FOM of 16fJ/C-S.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; CMOS; decision time quantization based redundancy; frequency 8 MHz; full half-bit redundancy; monotonicity switching algorithm; on-chip statistical time reference calibration; power 84 muW; size 0.13 mum; speed enhancements; supply variability; ternary successive approximation ADC; typical SAR comparator; voltage 0.8 V to 1.2 V; Calibration; Capacitors; Clocks; Delay; Quantization; Redundancy; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference (A-SSCC), 2011 IEEE Asian
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-1784-0
Type :
conf
DOI :
10.1109/ASSCC.2011.6123605
Filename :
6123605
Link To Document :
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