Temperature dependence of the high frequency response of Permalloy thin films

Author

Counil, G. ; Crozat, P. ; Kim, J. ; Devolder, T. ; Chappert, C. ; Zoll, S. ; Fournel, R.

Author_Institution

Inst. d´´Electron. Fondamentale, Orsay

fYear

2006

fDate

8-12 May 2006

Firstpage

430

Lastpage

430

Abstract

This study aims to determine the role of electron scattering in the damping mechanisms of magnetization and electrical resistivity of Permalloy thin films at varying temperatures. The complex dynamic susceptibility of the magnetic thin films are measured using ferromagnetic resonance technique. The resistivity follows a quadratic law with temperature which is attributed to electron-electron and electron-magnon scattering in the metallic magnetic materials.

Keywords

Permalloy; electrical resistivity; ferromagnetic materials; ferromagnetic resonance; magnetic susceptibility; magnetic thin films; magnetisation; magnons; metallic thin films; FeNi; Permalloy thin films; complex dynamic susceptibility; damping mechanisms; electrical resistivity; electron-electron scattering; electron-magnon scattering; ferromagnetic resonance; magnetic thin films; magnetization; metallic magnetic materials; quadratic law; Damping; Electric resistance; Electrons; Frequency response; Magnetic films; Magnetic susceptibility; Magnetization; Scattering; Temperature dependence; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2006. INTERMAG 2006. IEEE International

Conference_Location

San Diego, CA

Print_ISBN

1-4244-1479-2

Type

conf

DOI

10.1109/INTMAG.2006.376154

Filename

4261863