Title :
Temperature dependence of the high frequency response of Permalloy thin films
Author :
Counil, G. ; Crozat, P. ; Kim, J. ; Devolder, T. ; Chappert, C. ; Zoll, S. ; Fournel, R.
Author_Institution :
Inst. d´´Electron. Fondamentale, Orsay
Abstract :
This study aims to determine the role of electron scattering in the damping mechanisms of magnetization and electrical resistivity of Permalloy thin films at varying temperatures. The complex dynamic susceptibility of the magnetic thin films are measured using ferromagnetic resonance technique. The resistivity follows a quadratic law with temperature which is attributed to electron-electron and electron-magnon scattering in the metallic magnetic materials.
Keywords :
Permalloy; electrical resistivity; ferromagnetic materials; ferromagnetic resonance; magnetic susceptibility; magnetic thin films; magnetisation; magnons; metallic thin films; FeNi; Permalloy thin films; complex dynamic susceptibility; damping mechanisms; electrical resistivity; electron-electron scattering; electron-magnon scattering; ferromagnetic resonance; magnetic thin films; magnetization; metallic magnetic materials; quadratic law; Damping; Electric resistance; Electrons; Frequency response; Magnetic films; Magnetic susceptibility; Magnetization; Scattering; Temperature dependence; Transistors;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.376154
