Title :
Test and characterization of 1 bit Σ — Δ modulator
Author :
Abbes, K. ; Hentati, A. ; Masmoudi, M.
Author_Institution :
Electr. Dept., Nat. Eng. Sch. of Sfax (ENIS), Sfax
Abstract :
This paper presents a built-in self test (BIST) methodology to measure offset error and gain error of SigmaDelta modulator. This structure is made up of a generator of stimulus and an analyzer of response. We propose a digital technique for the test of static characteristics of the modulator. A memory based signal generator is presented which can concurrently produce test stimuli and reference signals. A first order SigmaDelta is evaluated and the simulation results show the static errors effect on the modulator bitstream output.
Keywords :
built-in self test; logic testing; sigma-delta modulation; signal generators; 1 bit Sigma-Delta modulator; BIST methodology; built-in self test; digital test technique; gain error measurement; memory based signal generator; modulator bitstream output; offset error measurement; signal analyser; Analog-digital conversion; Automatic testing; Built-in self-test; CMOS technology; Circuit testing; Costs; Delta modulation; Delta-sigma modulation; Histograms; Integrated circuit technology;
Conference_Titel :
Systems, Signals and Devices, 2008. IEEE SSD 2008. 5th International Multi-Conference on
Conference_Location :
Amman
Print_ISBN :
978-1-4244-2205-0
Electronic_ISBN :
978-1-4244-2206-7
DOI :
10.1109/SSD.2008.4632875
