DocumentCode :
2940881
Title :
Picosecond time-resolved photoluminescence microscopy of short period impurity free vacancy disordered AlGaAs gratings
Author :
Smith, J.M. ; Buller, G.S. ; Helmy, A.S. ; Bryce, A.C. ; Marsh, J.H.
Author_Institution :
Dept. of Phys., Heriot-Watt Univ., Edinburgh, UK
fYear :
2000
fDate :
10-15 Sept. 2000
Abstract :
Summary form only given. Impurity free vacancy disordering (IFVD) is a post-growth means of cation intermixing in binary semiconductor heterostructures that can be used to produce lateral modulation of the constituent material without the need for deep etching and growth procedures, and thus has enormous potential for the integration of such features as optical waveguides and quantum confined heterostructures into planar devices. IFVD is performed by coating the semiconductor surface with SiO/sub 2/ or with SiO/sub 2/:P prior to an anneal stage, resulting in distinct intermixing-enhanced and intermixing-suppressed regions, respectively due to a difference in the associated rates of cation out-diffusion. We have performed time-resolved photoluminescence microscopy on GaAs/AlGaAs multiple quantum wells that have been processed into one dimensional gratings by spatially selective IFVD. Results indicate that a complex relationship exists between the absolute stripe widths, the stripe width ratio, and the period, in determining the optical properties of the grating.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; optical microscopy; photoluminescence; semiconductor quantum wells; time resolved spectra; vacancies (crystal); GaAs-AlGaAs; absolute stripe widths; cation intermixing; impurity free vacancy disordering; intermixing-enhanced regions; intermixing-suppressed regions; lateral modulation; multiple quantum wells; one dimensional gratings; short period gratings; stripe period; stripe width ratio; time-resolved photoluminescence microscopy; Etching; Gratings; Integrated optics; Microscopy; Optical devices; Optical materials; Optical modulation; Photoluminescence; Semiconductor impurities; Semiconductor materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 2000. Conference Digest. 2000 International
Conference_Location :
Nice, France
Print_ISBN :
0-7803-6318-3
Type :
conf
DOI :
10.1109/IQEC.2000.908096
Filename :
908096
Link To Document :
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