Title :
Piezoresistive 6-MNA coated microcantilevers with signal conditioning circuits for electronic nose
Author :
Gilda, Neena A. ; Patil, Sheetal ; Seena, V. ; Joshi, Sanjay ; Thaker, Viral ; Thakur, Sanket ; Anvesha, A. ; Baghini, M. Shojaei ; Sharma, D.K. ; Rao, V. Ramgopal
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol.-Bombay, Mumbai, India
Abstract :
This paper presents a micro cantilever based piezo-resistive sensor and its fabrication process along with two different techniques for signal conditioning of sensor output aimed for artificial nose applications. The proposed micro-cantilevers feature a special coating of 6-Marcaptonicotonic acid (6-MNA) on one side of the cantilever which leads to a selective reaction of the target analyte molecules with the functionalized cantilever surface. Two signal conditioning schemes, a novel current excitation method and a resistance to frequency conversion (RFC) method using a new proposed circuit are implemented to precisely read the piezo-resistance changes. Current excitation method is implemented using commercial ICs while RFC method is implemented using a low-power test chip constituting of instrumentation amplifier, buffer and comparator in 180nm mixed-mode CMOS technology. It is shown that the implemented RFC method provides a resolution of 5ppm and is useful for low-cost on-chip measurements involving the piezo-resistive sensors. Implemented current excitation method provides measurement resolution of 40 parts per billion with minimum SNR value of 5 dB which is better than previously-reported values.
Keywords :
CMOS integrated circuits; buffer circuits; cantilevers; comparators (circuits); electronic noses; instrumentation amplifiers; microfabrication; microsensors; piezoelectric transducers; signal conditioning circuits; RFC method; analyte molecules; artificial nose; buffer; comparator; current excitation method; electronic nose; functionalized cantilever surface; instrumentation amplifier; low-cost on-chip measurements; low-power test chip; marcaptonicotonic acid coating; microfabrication process; mixed-mode CMOS technology; piezoresistive coated microcantilevers; piezoresistive sensor; resistance to frequency conversion method; signal conditioning circuits; size 180 nm; Bridge circuits; Current measurement; Frequency measurement; Polymers; Semiconductor device measurement; Sensitivity; Temperature measurement;
Conference_Titel :
Solid State Circuits Conference (A-SSCC), 2011 IEEE Asian
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-1784-0
DOI :
10.1109/ASSCC.2011.6123619