DocumentCode :
2941014
Title :
Return Field Induced Partial Erasure in Trailing Edge Shielded Perpendicular Writers
Author :
Bai, D.Z. ; Luo, P. ; Torabi, A. ; Terrill, D. ; Wang, J. ; Stoev, K. ; Liu, F.
Author_Institution :
Western Digital Corp., Fremont
fYear :
2006
fDate :
8-12 May 2006
Firstpage :
441
Lastpage :
441
Abstract :
Trailing edge shielded pole head is the primary writer design for perpendicular recording (PMR) with soft under layer (SUL), due to its higher field gradient compared to a single pole head. In this paper, both by modeling and by experiments, with certain combinations of head, media, SUL, and write current, the return field induced partial erasure (RFPE) will occur, causing recording performance degradation was demonstrated. Therefore, head, media and system optimizations are necessary in order to avoid this issue. The finite element modeling results of the on-track Stoner-Wohlfarth field for three write currents are obtained. It can be seen that both the recording field from the main pole (MP) and the return field increase with increasing write current. Micromagnetic write modeling has also been done, which showed written magnetization patterns consistent with the experimental data.
Keywords :
finite element analysis; magnetic heads; magnetisation; micromagnetics; optimisation; perpendicular magnetic recording; PMR; RFPE; finite element modeling; head; magnetization patterns; micromagnetic write modeling; optimization; perpendicular recording; primary writer design; return field induced partial erasure; soft under layer; trailing edge shielded pole head; write current; Degradation; Demagnetization; Digital recording; Finite element methods; Magnetic heads; Magnetization; Perpendicular magnetic recording; Power system modeling; Switches; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
Type :
conf
DOI :
10.1109/INTMAG.2006.376165
Filename :
4261874
Link To Document :
بازگشت