Title :
Nanometer scale correlation of magnetic and structural features in Ni2MnGa
Author :
Sasso, C.P. ; Pasquale, M. ; Celegato, F. ; Olivetti, E. ; Chernenko, V.A.
Author_Institution :
IEN Galileo Ferraris, Torino
Abstract :
In this work we present experimental results and a discussion of the structural and magnetic features leading to a minimum magnetic correlation length of the order of 20 nm thick films of Ni2MnGa deposited on MgO substrates. The study is conducted using a vibrating sample magnetometer (VSM) for the magnetic characterization and an atomic force-magnetic force microscope (AFM-MFM) setup, which allows for simultaneous imaging of the structural and magnetic characteristics of the sample surface. The magnetization curves show a coercivity of the order of 4-10 kA/m and an anisotropy field of the order of 160-300 kA/m.
Keywords :
coercive force; gallium alloys; magnetic anisotropy; magnetometers; manganese alloys; metallic thin films; nickel alloys; MgO; Ni2MnGa; anisotropy field; atomic force-magnetic force microscope; coercivity; magnetic characterization; magnetic correlation length; magnetization curves; nanometer scale correlation; thick films; vibrating sample magnetometer; Anisotropic magnetoresistance; Atomic force microscopy; Atomic layer deposition; Coercive force; Magnetic anisotropy; Magnetic force microscopy; Magnetization; Magnetometers; Perpendicular magnetic anisotropy; Thick films;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.376184
