Reflectivity of one-dimensional rough surfaces using the ray tracing technique with multiple reflections

In this paper, the reflectivity with multiple reflections of an one-dimensional rough dielectric surface is computed with a ray tracing method, based on the geometric optics approximation. The average reflectivity is obtained by generating the surface from Monte Carlo method. For a single reflection, perfectly conducting surface and by assuming a Gaussian process and height correlation, there is a very good agreement between the numerical and analytical models, including the shadowing effect. This allows us to validate the numerical method. When the double reflection is considered, the energy conservation test is improved for higher rms slope and incidence angles. In addition, there is a good concordance between the numerical method and the analytical model provided by Lynch et al.